Resisitivity 4 points square

Measuring sheet resistivity   /   IEF

Contacts :   VILLEBASSE   Cedric     /   VILLEBASSE   Cedric

Measurement of the resistivity of a thin or thick film using the 4-point in square method. This technique involves bringing four equally spaced probes in contact with a material of unknown resistance.

  • Space
    4 tips square

Caractéristiques

  • Min sample size   :   2 mm
  • Max sample size   :   2 inches
  • Support force   :   60 / 10 g
  • Curvature radius of the tips   :   25 / 500 µm
  • Tips distance   :   0.635 mm