ChAracterizations with Mechanical Electrical and Optical devices

 

A short description of the ressource

 

Ellipsometer Woollam M2000

Spectroscopic ellipsometer

Profilometer Dektak XT 1

Mechanical profilometer

Profilometer Dektak XT 2

Mechanical profilometer

Reflectometer Sentech RM2k

Spectroscopic reflectometer

Contact angle meter Appolo

Contact angle measuring system

Prober Karl Süss Casade PM5

Manual Electric Probe System

Microscope Olympus BX-51 1

Optical microscope

Microscope Leica DM6

Optical microscope

Binocular Olympus SZX7

Stereo zoom microscope

Binocular Nikon SMZ1000

Stereo zoom microscope

FTIR Varian small sample

FTIR small sample

Resisitivity 4 points square

Measuring sheet resistivity

FTIR Varian large sample

FTIR Large Sample

Measuring flatness Lapmaster

Measuring flatness 6 inches for viewing Brewster fringes and Newton's rings