Electrical and Physico-Chemical Characterizations

 

A short description of the ressource

 

Profilomètre Dektak 08

Mechanical profilometer

4pttesSR

Measurement of the resistivity of a thin or thick film using the 4-point in-line method.

Electric Probe System PM5

Manual Electric Probe System

Ellipsometer Woollam

Index and thickness measurement of thin layers

Ellipso HORIBA UVISEL 2

Spectroscopic Ellipsometer (190nm-2000nm)

Electric Probe System PM8

Manual Electric Probe System

Probes station for capacitance measurement

Probes station for capacitance measurement

Reflectometer

Contactless, optical reflection measurement at normal incidence for the characterization of thin films and bulk materials

BX-51

optical microscope

BX-51

optical microscope

BH-2

optical microscope

Resisitivity 4 points square

Measurement of the resistivity of a thin or thick film using the 4-point in sqare method.

Hall effect measurement Ecopia

Hall effect measurement to determine the electrical properties of the layers.

Ellipsometer Plasmos

Mono-wavelength ellipsometer

profilométre veeco Dektak 8

mechanical profilometer

Profilometer optic M3D

Optical profilometer vibrometer

Profilometer Zoomsurf

Optical profilometer vibrometer

Binocular Nikon SMZ1000

Short Description

Binocular Olympus SZX7

Short Description

Contact Angle

Determination of contact angles, Surface tension Measurements, Surface free energy

Mechanical profilometer Tencor

Mechanical profilometer