Electrical and Physico-Chemical Characterizations

 

A short description of the ressource

 

Ellipsometer Woollam

Short Description

Station PM5 Suss-Microtec

Short Description

Ellipso HORIBA UVISEL 2

Spectroscopic Ellipsometer (190nm-2000nm)

PM8

Short Description

Capacimètre

Short Description

profilométre Tencor IQ

mechanical profilometer

reflectométre

Contactless, optical reflection measurement at normal incidence for the characterization of thin films and bulk materials

BX-51

optical microscope

BX-51

optical microscope

Banc test Laser

Short Description

BH-2

optical microscope

4pttescarré

Short Description

Ecopia

Electrical properties are one of the most sensitive indicators of changes like semiconductor material and play an important role in widespread applications.

Plasmos

Short Description

4-points resistivity measurement online

Measurement of the resistivity of a thin or thick film using the 4-point in-line method.

profilométre veeco Dektak 8

mechanical profilometer

Profilometer mecanic Temcor

Short Description

Profilometer Zoomsurf

Short Description

Profilometer optic M3D

Short Description

Contact Angle

Determination of contact angles, Surface tension Measurements, Surface free energy

Binocular Nikon SMZ1000

Short Description

Binocular Olympus SZX7

Short Description

Mechanical profilometer Dektak 8 training room

Short Description