Electron and Near-Field Microscopy

 

A short description of the ressource

 

Verios_G4_HP

XHR Scanning Electron Microscope.

MAGELLAN_400L

XHR Scanning Electron Microscope.

MEB_Hitachi_SU8000

Cold FEG Scanning Electron Microscope.

MEB_HITACHI_S4800

Cold FEG Scanning Electron Microscope

MEB_Philips_XL30SFEG

FEG Schottky Scanning Electron Microscope (UHR and HR modes).

Philips XL40 LaB6

Large chamber LaB6 Scanning Electron Microscope + Micro-manipulators

MEB_Hitachi_S3600N

Large Variable Pressure (low vac/high vac) Scanning Electron Microscope Tungsten filament.

MEB_Hitachi_S2600N

Low Vacuum tabletop SEM, small chamber

LEO_1430

Large tilt Scanning Electron Microscope + EDX

AFM_Agilent_Pico+

Small Atomic Force Microscope

AFM_Agilent_5500LS_PicoMaps

Large Atomic Force Microscope

FTIR_petit_éch-Microscope_vis-I

FTIR small sample

FTIR_grand_éch_

FTIR Large Sample