Electron and Near-Field Microscopy

 

A short description of the ressource

 

MEB Verios G4 HP

XHR Scanning Electron Microscope

MEB Magellan 400L

XHR Scanning Electron Microscope

MEB Hitachi SU8000

Cold FEG Scanning Electron Microscope

MEB Hitachi S4800

Cold FEG Scanning Electron Microscope

MEB Philips XL30 SFEG

FEG Schottky Scanning Electron Microscope (UHR and HR modes)

Philips XL40 LaB6

Large chamber LaB6 Scanning Electron Microscope + Micro-manipulators

MEB Hitachi S3600N

Large Variable Pressure (low vac/high vac) Scanning Electron Microscope Tungsten filament

MEB Hitachi S2600N

Low Vacuum tabletop SEM, small chamber

MEB Zeiss LEO 1430

Large tilt Scanning Electron Microscope + EDX

AFM Agilent Pico+

Small Atomic Force Microscope

AFM Agilent 5500LS PicoMaps

Large Atomic Force Microscope

FTIR Varian small sample

FTIR small sample

FTIR Varian large sample

FTIR Large Sample

Métalliseur Au-Evaporateur C

Pulvérisateur Au-Evaporateur C