Electrical properties are one of the most sensitive indicators of changes like semiconductor material and play an important role in widespread applications.   /   ECOPIA

Contacts :   VILLEBASSE   Cedric     /   HERTH   Etienne

DC measurement modes I-V curve, I-R curve Checking Ohmic contacts, Van der Pauw and Hall Bar measurements Semiconductors n-type & p-type, Materials : Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCOs, metals, etc.. Measurement Temperature: 300K (room temperature), 77K (Liquid Nitrogen) Sample size 6mm x 6mm to – 20mm x 20mm. Magnetic flux density of 0.55T (permanent magnet) Concentration range: 1E7 to 1E21 (cm-3)


  • Voltage   :   1µV-2V
  • Resistivity   :   1E-4 to 1E7 Ohms-cm
  • Mobility   :   1-1E7 cm²/volt-sec
  • Temperature   :   300K and 77K (Liquid Nitrogen)
  • Current   :   1nA-20mA

Electrical Propertie

The most common way of measuring the resistivity of a semiconductor material is by using a four-point collinear probe. This technique involves bringing four equally spaced probes in contact with a material of unknown resistance.

Contacts : C. Villebasse & E. Herth


Material sciences

The systems can be used to characterize various materials including semiconductors and compound semiconductors

Contacts : C. Villebasse & E. Herth