Profilometer Dektak XT 1
Mechanical profilometer / BRUKER
Contacts : DURNEZ Alan
/ THOMASSET Muriel
Location : E81
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Dektak XT
Caractéristiques
- Resolution : 1 Å @ 6.5 μm
- Resolution : 10 Å @ 65.5 μm
- Resolution : 80 Å @ 524 μm
- Resolution : 150 Å @ 1mm
- Stylus type : 2 µm
- Scanning distance : 200 mm
- Support force : 0.03-15 mg
- Sample Size : 8 pouces
