Centre for Nanoscience
and Nanotechnology

  • CNRS
  • UPSaclay
  • UParis

PIMENT Platform

Profilometer Stylus Dektak XT

Mechanical profilometer   /   Bruker

Contacts :   DURNEZ   Alan  

  • Space
    Dektak XT

Caractéristiques

  • Resolution   :   1 Å @ 6.5 μm
  • Resolution   :   10 Å @ 65.5 μm
  • Resolution   :   80 Å @ 524 μm
  • Resolution   :   150 Å @ 1mm
  • Sample Size   :   6 pouce
  • Scanning distance   :   1 mm max
  • Stylus type   :   2 µm
  • Scanning distance   :   200 mm
  • Support force   :   0.03-15 mg