Centre for Nanoscienceand Nanotechnology
PIMENT Platform
Contacts : BAYLE Fabien
FTIR-MIR with Large Sample automated Loader, ATR, and specular reflection PIKE accessories
Caractéristiques
Mid-Infra-Red absorption spectrometry 4000 – 400 cm^-1 (2,5 - 25 µm)
Contacts : Fabien BAYLE, Etienne HERTH
Wafers, thin films thickness (mapping)
Contacts : Fabien BAYLE
Identification and quantification of chemical bonds, mapping
Contacts : Fabien BAYLE, François MAILLARD
Growth, surface treatments and functionalization. Substitution atoms, interstitials (C, O). Refractive index changes due to free carriers (doping).
Gazeous atmosphere within encapsulation
Electrochemistry, corrosion