SEM Thermo Magellan 400 L
Extreme High Resolution scanning electron microscope with integrated EDX system / FEI
Contacts : DUPUIS Christophe
/ MAHUT Frédéric
Location : SB044-E342
eXtra High Resolution Scanning Electron Microscope. Equipped with a STEM detector, an EDS INCA system and a vCD detector (for BSED at low voltage).
Caractéristiques
- Resolution : 0.9 nm @ 1kV
- Max sample size : 4 inches wafers, 5 inches photomask
- Stage : 5 axis compucentric piezo stage, deceleration
- Detectors : SE (ETD, TLD), BSE (vCD), EDS X-Max (50mm^2), STEM
- Electron gun : FEG Schottky (+"UniColor" monochromator)
- Objective lens : Field Free (Search mode), Immersion
- Voltage : 200V - 30kV
- Current : 1.6 pA to 100 nA
- Resolution : STEM mode: 1nm@30kV
- Magnification : x30 to 2000000x (Polaroïd)
- Others : Anticontaminator (cold trap), plasma cleaner
- Others : Autoloader
- Others : Column Elstar (no mechanical alignment)