Centre for Nanoscience
and Nanotechnology

  • CNRS
  • UPSaclay
  • UParis

PIMENT Platform

MEB Hitachi S4800

Cold FEG Scanning Electron Microscope   /   HITACHI

Contacts :   MAHUT   Frederic  

Cold FEG Scanning Electron Microscope. LM (Low Mag) and UHR (Ultra High Resolution) modes. SE BSE detectors

  • Space
    S4800
  • Space
    Pige de vérification de la hauteur
  • Space
    Hitachi S4800
  • Space
    Vue générale
  • Space
    Overview of the system
  • Space
    Porte substrat petits échantillons tilt à 45°

Caractéristiques

  • Max acceleration voltage   :   30kV
  • Detectors   :   SE (Lower, Upper), BSE (Upper)
  • Stage   :   3 axes motorized stage, deceleration
  • Electron gun   :   W cold FEG emitter
  • Magnification   :   x30 to x800000
  • Max sample size   :   4 inches
  • Others   :   Anticontaminator (cold trap)
  • Others   :   Loadlock
  • Others   :   Column with 2-condenser
Expertises

Observation of nanostructures with SE, BSE

Observation of nanowires, quantum wells, patterns after electron beam lithography…

  • Space

Contacts : Christophe DUPUIS, Fabien BAYLE

Periodicity measurements

pitch calculation of a grating

  • Space
  • Space

Contacts : Christophe DUPUIS, Fabien BAYLE

Observation of photoresists

Low dose é imaging of spin-coated Photoresist layers and 3D lithography grown micro-structures (polymer)

  • Space
  • Space
  • Space

Contacts : Christophe DUPUIS, Fabien BAYLE

Applications

Observation of nanostructures with SE

Observation of nanowires, quantum wells, patterns after electron beam lithography...

  • Space

Contacts : Christophe DUPUIS, Fabien BAYLE