Centre for Nanoscience
and Nanotechnology

  • CNRS
  • UPSaclay
  • UParis

PIMENT Platform

Profilometer Stylus Veeco Dektak8

Mechanical profilometer   /   Veeco

Contacts :   DURNEZ   Alan  

Characterize film roughness, shape and stress in true 3D*

  • Space
    profilométre veeco Dektak 8
  • Space
    Profilometer mecanic Dektak8
  • Space
    Profilometer mecanic Dektak8 full view

Caractéristiques

  • Max sample size   :   200 mm
  • Cut   :   25 mm weight
  • Support force   :   0.1-15 mg
  • Resolution   :   7.5 angstrom 1σ repeatability, 1 angstrom resolution
  • Stylus type   :   2.5 µm