ChAracterizations with Mechanical Electrical and Optical devices

 

A short description of the ressource

 

Binocular Olympus SZX7

Stereo zoom microscope

Binocular Nikon SMZ1000

Stereo zoom microscope

Microscope Olympus BX-51 1

Optical microscope

Probe station capacimeter

Probes station for capacitance measurement

Ellipsometer Woollam M2000

Spectroscopic ellipsometer

Microscope Leica DM6

Optical microscope

Profilometer Dektak XT 2

Mechanical profilometer

Reflectometer Sentech RM2k

Spectroscopic reflectometer

Hall effect Ecopia

Hall effect measurement

Probe stand Microworld

Measurement of the resistivity of a thin or thick film using the 4-point in-line method.

Profilometer Dektak XT 1

Mechanical profilometer

Contact angle meter Appolo

Contact angle measuring system

Microscope Olympus BX-51 2

Optical microscope

Measuring flatness Lapmaster

Measuring flatness 6 inches for viewing Brewster fringes and Newton's rings

Prober Karl Süss Casade PM5

Manual Electric Probe System

Laser test system

Laser test hood with probes station

Profilometer Tencor D500

Mechanical profilometer

Microscope Olympus BH-2

Optical microscope