ChAracterizations with Mechanical Electrical and Optical devices

 

A short description of the ressource

 

Binocular Olympus SZX7

Stereo zoom microscope

Binocular Nikon SMZ1000

Stereo zoom microscope

Microscope Olympus BX-51 1

Optical microscope

Probe station capacimeter

Probes station for capacitance measurement

Ellipsometer Woollam M2000

Spectroscopic ellipsometer

Microscope Leica DM6

Optical microscope

Profilometer Dektak XT 2

Mechanical profilometer

Reflectometer Sentech RM2k

Spectroscopic reflectometer

Hall effect Ecopia

Hall effect measurement

Probe stand Microworld

Measurement of the resistivity of a thin or thick film using the 4-point in-line method.

Profilometer Dektak XT 1

Mechanical profilometer

Contact angle meter Appolo

Contact angle measuring system

Microscope Olympus BX-51 2

Optical microscope

Prober Karl Süss Casade PM5

Manual Electric Probe System

Laser test system

Laser test hood with probes station

Profilometer Tencor D500

Mechanical profilometer

Microscope Olympus BH-2

Optical microscope