ChAracterizations with Mechanical Electrical and Optical devices

 

A short description of the ressource

 

Binocular Olympus SZX7

Stereo zoom microscope

Binocular Nikon SMZ1000

Stereo zoom microscope

Microscope Olympus BH-2

Optical microscope

Microscope Olympus BX-51 1

Optical microscope

Probe station capacimeter

Probes station for capacitance measurement

Reflectometer Sentech RM2k

Spectroscopic reflectometer

Microscope Leica DM6

Optical microscope

Contact angle meter Appolo

Contact angle measuring system

Ellipsometer Woollam M2000

Spectroscopic ellipsometer

Profilometer Dektak XT 2

Mechanical profilometer

Profilometer Dektak XT 1

Mechanical profilometer

Hall effect Ecopia

Hall effect measurement

Probe stand Microworld

Measurement of the resistivity of a thin or thick film using the 4-point in-line method.

Prober Karl Süss Casade PM5

Manual Electric Probe System

Microscope Olympus BX-51 2

Optical microscope

Profilometer Tencor D500

Mechanical profilometer

Laser test system

Laser test hood with probes station