Ellipsometer Woollam M2000

Spectroscopic ellipsometer

Profilometer Dektak XT 1

Mechanical profilometer

Profilometer Dektak XT 2

Mechanical profilometer

Reflectometer Sentech RM2k

Spectroscopic reflectometer

Contact angle meter Appolo

Contact angle measuring system

Prober Karl Süss Casade PM5

Manual Electric Probe System

Binocular Olympus SZX7

Stereo zoom microscope

Binocular Nikon SMZ1000

Stereo zoom microscope

Probe station capacimeter

Probes station for capacitance measurement

Microscope Olympus BX-51 1

Optical microscope

Hall effect Ecopia

Hall effect measurement

Microscope Olympus BH-2

Optical microscope

Probe stand Microworld

Measurement of the resistivity of a thin or thick film using the 4-point in-line method.

FTIR Varian large sample

FTIR Large Sample

Microscope Olympus BX-51 2

Optical microscope

Measuring flatness Lapmaster

Measuring flatness 6 inches for viewing Brewster fringes and Newton's rings

FTIR Varian small sample

FTIR small sample

Laser test system

Laser test hood with probes station

Microscope Leica DM6

Optical microscope